Figure 1.

Heat-shock exposition of yeast cells leads to the formation of an unexpected circular structure. AFM deflection images of surface topology of a living yeast cell at 30°C (unstressed) (A, A’) or exposed to heat shock during 1 h at 42°C (heat-shocked) (B, B’). Yeast cells were trapped in polycarbonate porous membrane (top panel) or within the patterns of a PDMS stamp (back panel). Bud scar (BS) and circular structure (CS) are indicated on AFM images.

Pillet et al. BMC Biology 2014 12:6   doi:10.1186/1741-7007-12-6
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