Table 3 |
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|
Parameters fitted with the Arrhenius law of the probability for the occurrence of structural defects upon cooling from the melt. |
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|
Size |
ZSi-O = 2 |
ZSi-O = 3 |
ZO-Si = 1 |
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|
|
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|
Aij |
Eij (K) |
Aij |
Eij (K) |
Aij |
Eij (K) |
|
|
|
||||||
|
2 nm |
1.884 |
13052.693 |
1.781 |
4870.674 |
0.954 |
4033.876 |
|
4 nm |
2.223 |
16215.199 |
2.435 |
6515.887 |
1.162 |
5919.718 |
|
6 nm |
3.273 |
18964.670 |
2.782 |
7391.125 |
1.303 |
6814.464 |
|
Data in [9] |
58.600 |
31100.000 |
8.900 |
24760.000 |
||
|
|
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|
Xuan Huynh et al. PMC Physics B 2008 1:16 doi:10.1186/1754-0429-1-16 |
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